Highest sensitivity for medium and heavy elements; optimized for the analysis of environmental and process-critical elements.
The SPECTRO XEPOS HE uses a 50 Watt endwindow X-ray tube to excite the samples. The target changer, with up to 8 polarization and secondary targets, offers many different excitation conditions ensuring optimum determination of the middle to heavy elements. The application range covers the elements from Na to U. A shutter improves the stability of the system by enabling the sample to be changed without having to turn off the X-ray tube. Consistent X-ray tube performance is ensured by the uninterruptible power supply (UPS) that compensates for power fluctuations. Measurements can be conducted in a He gas atmosphere or in a vacuum; many applications even in air.
The detector is a state-of-the-art silicon drift detector. The resolution remains stable, regardless of the count rate. Internal collimators greatly improve the signal/noise ratio. A resolution of less than 155 eV at Mn K-alpha is achieved. The high spectral resolution at high count rates results in reduced measuring times and improved measurement accuracy.
Not only powerful analytical components, but also exact sample presentation is critical for exceptional analytical performance. This was a special consideration during development of the SPECTRO XEPOS HE. The precision of the sample changer and a new generation of sample trays dramatically reduce the effects of mechanical and physical fluctuations; improving analytical results. The analyzer can handle samples with diameters of 32 mm, 40 mm and 52 mm. The sample chamber can be equipped with a sample spinner for 40 mm sample cups to further improve the measurement results for inhomogeneous samples or irregular surfaces.
SPECTRO XEPOS HE:
- Highest sensitivity for medium and heavy elements.
- High precision auto sampler with sample trays for various sample diameters.
- Pre-calibrated application packages.
- Intuitive software.